Characterisation of the VG ESCALAB instrumental broadening functions by XPS measurements at the Fermi edge of silver

Autor(en): Mahl, S
Neumann, M
Dieckhoff, S
Schlett, V
Baalmann, A
Stichwörter: DECONVOLUTION; Fermi edge; line broadening; photoelectron spectroscopy; RESOLUTION; SPECTRA; Spectroscopy; X-RAY PHOTOEMISSION
Erscheinungsdatum: 1997
Herausgeber: ELSEVIER SCIENCE BV
Journal: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volumen: 85
Ausgabe: 3
Startseite: 197
Seitenende: 203
Zusammenfassung: 
A mathematical algorithm is presented to determine the broadening function of an XPS spectrometer using smoothed first derivatives of experimental Fermi edges for the VG ESCALAB 220i-XL instrument at various pass energies. Different smoothing algorithms were applied and optimal parameter sets are discussed, as this has not been done before. The smallest error in the determination of the broadening function occurred with the usage of spline functions. It is shown that the broadening function of the spectrometer can be well described by a symmetrical Gaussian function. The resolution and the intensity dependence on the pass energy is determined for the spectrometer, as well a.s the linewidth of the monochromated X-rays. (C) 1997 Elsevier Science B.V.
ISSN: 03682048
DOI: 10.1016/S0368-2048(97)00074-1

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