DC Element | Wert | Sprache |
dc.contributor.author | Jager, B | |
dc.contributor.author | Schurmann, H | |
dc.contributor.author | Muller, HU | |
dc.contributor.author | Himmel, HJ | |
dc.contributor.author | Neumann, M | |
dc.contributor.author | Grunze, M | |
dc.contributor.author | Woll, C | |
dc.date.accessioned | 2021-12-23T16:10:55Z | - |
dc.date.available | 2021-12-23T16:10:55Z | - |
dc.date.issued | 1997 | |
dc.identifier.issn | 09429352 | |
dc.identifier.uri | https://osnascholar.ub.uni-osnabrueck.de/handle/unios/9455 | - |
dc.description.abstract | In a previous communication we presented X-ray photoelectron (XP) spectra of alkanethiolate monolayers deposited from solution onto Au-substrates. In the S2p XP-spectra two different sulfur species were detected, and interpreted as evidence for disulfide formation, in agreement with an earlier report using grazing incidence X-ray diffraction (GIXRD) [P. Fenter, A. Eberhardt and P. Eisenberger, Science 266 (1994) 1216]. Here we present new experiments revealing that alkanethiolate monolayers adsorbed on Au exhibit an unexpectedly high cross section for X-ray induced damage. This observation makes a reinterpretation of the previous XPS data necessary, which - together with new data reveals that the second S-species observed in the previous experiments (which was interpreted to indicate disulfide formation) is due to beam damage. The relevance of this X-ray induced beam-damage for the interpretation of the GIXRD-data will be discussed. Data obtained with soft X-ray absorption spectroscopy (NEXAFS) for alkanethiolate monolayers exposed to low energy electrons in the typical energy range of secondary electrons (E = 0 - 50 eV) reveal the formation of C = C double bonds and provides evidence that the X-ray induced damage is caused by the secondary electrons resulting from the photoemission process. | |
dc.language.iso | en | |
dc.publisher | R OLDENBOURG VERLAG | |
dc.relation.ispartof | ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-INTERNATIONAL JOURNAL OF RESEARCH IN PHYSICAL CHEMISTRY & CHEMICAL PHYSICS | |
dc.subject | alkanethiolates | |
dc.subject | AU(111) | |
dc.subject | Chemistry | |
dc.subject | Chemistry, Physical | |
dc.subject | DISULFIDES | |
dc.subject | E-beam damage | |
dc.subject | GOLD SURFACES | |
dc.subject | NEXAFS | |
dc.subject | ORGANIC FILMS | |
dc.subject | ORIENTATION | |
dc.subject | self assembled monolayers | |
dc.subject | SUPERLATTICE STRUCTURE | |
dc.subject | THIOLS | |
dc.subject | X-ray exposure | |
dc.title | X-ray and low energy electron induced damage in alkanethiolate monolayers on Au-substrates | |
dc.type | journal article | |
dc.identifier.doi | 10.1524/zpch.1997.202.Part_1_2.263 | |
dc.identifier.isi | ISI:A1997YG62900019 | |
dc.description.volume | 202 | |
dc.description.issue | 1-2 | |
dc.description.startpage | 263 | |
dc.description.endpage | 272 | |
dc.contributor.orcid | 0000-0003-1078-3304 | |
dc.contributor.researcherid | O-2912-2019 | |
dc.contributor.researcherid | H-1600-2013 | |
dc.contributor.researcherid | D-5563-2011 | |
dc.publisher.place | LEKTORAT M/N, K BERBER-NERLINGER, POSTFACH 80 13 60, D-81613 MUNCHEN, GERMANY | |
dcterms.isPartOf.abbreviation | Z. Phys. Chemie-Int. J. Res. Phys. Chem. Chem. Phys. | |