Electronic properties of epitaxial Cu films on Pt(100)

Autor(en): Willerding, B
Oster, K
Radnik, J
Braun, J
Wandelt, K
Stichwörter: crystallographic structure; electronic structure; epitaxial Cu films; Spectroscopy; SURFACE
Erscheinungsdatum: 1998
Herausgeber: ELSEVIER SCIENCE BV
Journal: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volumen: 93
Ausgabe: 1-3
Startseite: 215
Seitenende: 219
Zusammenfassung: 
In this contribution we present angular resolved UPS valence band spectra of epitaxial Cu(100) films of 1 to 13 ML thickness grown on Pt(100). The growth structure of the Cu(100) films was determined by LEED and STM. The corresponding ARUPS Cu(3d) valence band spectra are compared with theoretical calculations within the framework of a fully relativistic one-step model of photoemission. (C) 1998 Elsevier Science B.V. All rights reserved.
Beschreibung: 
4th International Workshop on Auger Spectroscopy and Electronic Structure, JULICH, GERMANY, JUN, 1997
ISSN: 03682048
DOI: 10.1016/S0368-2048(98)00177-7

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