THE INFLUENCE OF DEFECTS ON THE NI-2P AND O-1S XPS OF NIO

DC FieldValueLanguage
dc.contributor.authorUHLENBROCK, S
dc.contributor.authorSCHARFSCHWERDT, C
dc.contributor.authorNEUMANN, M
dc.contributor.authorILLING, G
dc.contributor.authorFREUND, HJ
dc.date.accessioned2021-12-23T16:11:30Z-
dc.date.available2021-12-23T16:11:30Z-
dc.date.issued1992
dc.identifier.issn09538984
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/9740-
dc.description.abstractThe Ni 2p and O 1s XPS of NiO single crystals were measured using monochromatic Al Kalpha radiation. Different treatments of the crystals allow us to give a description of the influence of defects on these spectra. The Ni 2P3/2 spectrum of in-situ-cleaved NiO exibits clearly visible features at 854.1 eV, 855.6 eV and 861 eV. The intensity ratio changes after ion bombardment and an additional peak at 852.2 eV appears. Apart from a slight increase in linewidth the O 1s spectrum remains unchanged. The O 1s spectrum from an in-situ-cleaved NiO single crystal exhibits only a single peak at 529.4 eV which can be fitted by a Gaussian line profile. Further measurements allow us to attribute the well known O 1s satellite at 531.2 eV to emission from oxygen-containing species adsorbed at defects.
dc.language.isoen
dc.publisherIOP PUBLISHING LTD
dc.relation.ispartofJOURNAL OF PHYSICS-CONDENSED MATTER
dc.subjectBOMBARDMENT
dc.subjectOXIDE SYSTEMS
dc.subjectOXYGEN
dc.subjectPHOTOEMISSION
dc.subjectPhysics
dc.subjectPhysics, Condensed Matter
dc.subjectSURFACES
dc.titleTHE INFLUENCE OF DEFECTS ON THE NI-2P AND O-1S XPS OF NIO
dc.typejournal article
dc.identifier.doi10.1088/0953-8984/4/40/009
dc.identifier.isiISI:A1992JR98000009
dc.description.volume4
dc.description.issue40
dc.description.startpage7973
dc.description.endpage7978
dc.contributor.orcid0000-0001-5188-852X
dc.contributor.researcheridAAQ-8810-2020
dc.publisher.placeTECHNO HOUSE, REDCLIFFE WAY, BRISTOL, ENGLAND BS1 6NX
dcterms.isPartOf.abbreviationJ. Phys.-Condes. Matter
Show simple item record

Page view(s)

2
Last Week
0
Last month
0
checked on Apr 20, 2024

Google ScholarTM

Check

Altmetric