Vertical and lateral drift corrections of scanning probe microscopy images

DC FieldValueLanguage
dc.contributor.authorRahe, P.
dc.contributor.authorBechstein, R.
dc.contributor.authorKuehnle, A.
dc.date.accessioned2021-12-23T16:11:47Z-
dc.date.available2021-12-23T16:11:47Z-
dc.date.issued2010
dc.identifier.issn21662746
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/9880-
dc.description.abstractA procedure is presented for image correction of scanning probe microscopy data that is distorted by linear thermal drift. The procedure is based on common ideas for drift correction, which the authors combine to a comprehensive step-by-step description of how to measure drift velocities in all three dimensions and how to correct the images using these velocities. The presented method does not require any knowledge about size or shape of the imaged structures. Thus, it is applicable to any type of scanning probe microscopy image, including images lacking periodic structures. Besides providing a simple, ready-to-use description of lateral and vertical drift correction, they derive all formulas needed from the model of linear drift. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3360909]
dc.description.sponsorshipDeutsche Forschungsgemeinschaft (DFG)German Research Foundation (DFG) [KU 1980/1-2]; Financial support from the Deutsche Forschungsgemeinschaft (DFG) through the Emmy Noether grant KU 1980/1-2 is gratefully acknowledged.
dc.language.isoen
dc.publisherA V S AMER INST PHYSICS
dc.relation.ispartofJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
dc.subjectATOMIC-FORCE MICROSCOPY
dc.subjectCALIBRATION
dc.subjectCOMPENSATION
dc.subjectDIFFUSION
dc.subjectELIMINATION
dc.subjectEngineering
dc.subjectEngineering, Electrical & Electronic
dc.subjectNanoscience & Nanotechnology
dc.subjectPhysics
dc.subjectPhysics, Applied
dc.subjectRECONSTRUCTION
dc.subjectscanning probe microscopy
dc.subjectScience & Technology - Other Topics
dc.subjectSTM
dc.subjectTRACKING
dc.subjectTUNNELING-MICROSCOPY
dc.titleVertical and lateral drift corrections of scanning probe microscopy images
dc.typejournal article
dc.identifier.doi10.1116/1.3360909
dc.identifier.isiISI:000278182700114
dc.description.volume28
dc.description.issue3
dc.contributor.orcid0000-0002-2768-8381
dc.contributor.researcheridC-5080-2011
dc.contributor.researcheridE-8038-2011
dc.publisher.placeSTE 1 NO 1, 2 HUNTINGTON QUADRANGLE, MELVILLE, NY 11747-4502 USA
dcterms.isPartOf.abbreviationJ. Vac. Sci. Technol. B
dcterms.oaStatusGreen Published
crisitem.author.deptFB 04 - Physik-
crisitem.author.deptidfb04-
crisitem.author.orcid0000-0002-2768-8381-
crisitem.author.parentorgUniversität Osnabrück-
crisitem.author.netidRaPh610-
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