Investigating atomic details of the CaF2 (111) surface with a qPlus sensor

DC FieldValueLanguage
dc.contributor.authorGiessibl, FJ
dc.contributor.authorReichling, M
dc.date.accessioned2021-12-23T16:11:59Z-
dc.date.available2021-12-23T16:11:59Z-
dc.date.issued2005
dc.identifier.issn09574484
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/9984-
dc.description7th International Conference on Non-contact Atomic Force Microscopy, Seattle, WA, SEP 12-15, 2004
dc.description.abstractThe (111) surface of CaF2 has been intensively studied with large-amplitude frequency-modulation atomic force microscopy, and the atomic contrast formation is now well understood. It has been shown that the apparent contrast patterns obtained with a polar tip strongly depend on the tip terminating ion, and three sub-lattices of anions and cations can be imaged. Here, we study the details of atomic contrast formation on CaF2 (111) with small-amplitude force microscopy utilizing the qPlus sensor that has been shown to provide the utmost resolution at high scanning stability. Step edges resulting from cleaving crystals in situ in the ultra-high vacuum appear as very sharp structures, and on flat terraces the atomic corrugation is seen in high clarity even for large area scans. The atomic structure is also not lost when scanning across triple layer step edges. High-resolution scans of small surface areas yield contrast features of anion- and cation sub-lattices with unprecedented resolution. These contrast patterns are related to previously reported theoretical results.
dc.language.isoen
dc.publisherIOP PUBLISHING LTD
dc.relation.ispartofNANOTECHNOLOGY
dc.subjectCANTILEVERS
dc.subjectDYNAMIC FORCE MICROSCOPY
dc.subjectEPITAXY
dc.subjectMaterials Science
dc.subjectMaterials Science, Multidisciplinary
dc.subjectNanoscience & Nanotechnology
dc.subjectPhysics
dc.subjectPhysics, Applied
dc.subjectRESOLUTION
dc.subjectScience & Technology - Other Topics
dc.subjectSTABILITY
dc.titleInvestigating atomic details of the CaF2 (111) surface with a qPlus sensor
dc.typeconference paper
dc.identifier.doi10.1088/0957-4484/16/3/022
dc.identifier.isiISI:000228157900023
dc.description.volume16
dc.description.issue3, SI
dc.description.startpageS118-S124
dc.contributor.orcid0000-0002-5585-1326
dc.contributor.orcid0000-0003-3186-9000
dc.contributor.researcheridK-8022-2013
dc.contributor.researcheridB-1123-2011
dc.identifier.eissn13616528
dc.publisher.placeTEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
dcterms.isPartOf.abbreviationNanotechnology
dcterms.oaStatusGreen Submitted, Green Published
crisitem.author.deptFB 04 - Physik-
crisitem.author.deptidfb04-
crisitem.author.orcid0000-0003-3186-9000-
crisitem.author.parentorgUniversität Osnabrück-
crisitem.author.netidReMi818-
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