Thin Co films on Cu(111) studied by electron capture spectroscopy

Autor(en): Schleberger, M
Manske, J
Dirska, M
Stichwörter: Chemistry; Chemistry, Physical; Co thin films; CU(100); EXCITED TERMS; FAST ATOMS; FE(110); GRAZING SCATTERING; GROWTH; ion scattering; MAGNETIC-PROPERTIES; POLARIZED-LIGHT EMISSION; SURFACE MAGNETISM; ULTRATHIN FILMS
Erscheinungsdatum: 2005
Herausgeber: WILEY
Journal: SURFACE AND INTERFACE ANALYSIS
Volumen: 37
Ausgabe: 2
Startseite: 149
Seitenende: 153
Zusammenfassung: 
We have studied thin films of Co on Cu(111) single crystals with electron capture spectroscopy (ECS). The magnetism from the cobalt layer can be detected clearly in remanence and as a function of the outer magnetic field. The measured circular polarization of the emitted light is related directly to the structural and magnetic changes of the system, depending on the cobalt layer thickness. We find the set-in of in-plane magnetization at similar to2 monolayers of cobalt and the saturation of our signal at a film thickness of 7-8 monolayers. At coverages above 3-4 monolayers the increasing growth of hcp cobalt domains at the expense of fcc cobalt domains gives rise to a linearly increasing ECS signal up to 7.5 monolayers. We attribute this to the fact that the fcc cobalt domains are covered with copper, whereas the hcp cobalt domains expose cobalt in the upper layer. Monte-Carlo simulations of our ion scattering experiments show that great experimental care has to be taken in order to avoid excessive sputtering damage to the sample. By using moderate primary ion energies and small angles of incidence, thin films can be investigated with ECS in the grazing incidence geometry without changing the film structure. Copyright (C) 2005 John Wiley Sons, Ltd.
Beschreibung: 
4th International Symposium on Atomic Level Characterization for New Materials and Devices, Kauai, HI, OCT 05-10, 2003
ISSN: 01422421
DOI: 10.1002/sia.1952

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