Browsing by Author Geier, Johannes


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Issue DateTitleAuthor(s)
2019S3 guidelines: Epicutaneous patch testing with contact allergens and drugs - Short version, Part 1Mahler, Vera; Nast, Alexander; Bauer, Andrea; Becker, Detlef; Brasch, Jochen; Breuer, Kristine; Dickel, Heinrich ; Drexler, Hans; Elsner, Peter; Geier, Johannes; John, Swen Malte ; Kreft, Burkhard; Koellner, Arno; Merk, Hans; Ott, Hagen; Pleschka, Silvia; Portisch, Maria; Spornraft-Ragaller, Petra; Weisshaar, Elke; Werfel, Thomas; Worm, Margitta; Schnuch, Axel; Uter, Wolfgang
2019S3 Guidelines: Epicutaneous patch testing with contact allergens and drugs - Short version, Part 2.Mahler, Vera; Nast, Alexander; Bauer, Andrea; Becker, Detlef; Brasch, Jochen; Breuer, Kristine; Dickel, Heinrich ; Drexler, Hans; Elsner, Peter; Geier, Johannes; John, Swen Malte ; Kreft, Burkhard; Köllner, Arno; Merk, Hans F.; Ott, Hagen; Pleschka, Silvia; Portisch, Maria; Spornraft-Ragaller, Petra; Weisshaar, Elke; Werfel, Thomas; Worm, Margitta; Schnuch, Axel; Uter, Wolfgang
2019S3-Leitlinie: Durchfuhrung des Epikutantests mit Kontaktallergenen und Arzneimitteln - Kurzfassung Teil 2Mahler, Vera; Nast, Alexander; Bauer, Andrea; Becker, Detlef; Brasch, Jochen; Breuer, Kristine; Dickel, Heinrich ; Drexler, Hans; Elsner, Peter; Geier, Johannes; John, Swen Malte ; Kreft, Burkhard; Koellner, Arno; Merk, Hans; Ott, Hagen; Pleschka, Silvia; Portisch, Maria; Spornraft-Ragaller, Petra; Weisshaar, Elke; Werfel, Thomas; Worm, Margitta; Schnuch, Axel; Uter, Wolfgang
2016Sensitization to reactive diluents and hardeners in epoxy resin systems. IVDK data 2002-2011. Part I: reaction frequenciesGeier, Johannes; Lessmann, Holger; Hillen, Uwe; Skudlik, Christoph ; Jappe, Uta
2016Sensitization to reactive diluents and hardeners in epoxy resin systems. IVDK data 2002-2011. Part II: concomitant reactionsGeier, Johannes; Lessmann, Holger; Hillen, Uwe; Skudlik, Christoph ; Jappe, Uta
2019Tertiary prevention of occupational skin diseases: Prevalence of allergic contact dermatitis and pattern of patch test resultsBrans, Richard ; Schroeder-Kraft, Claudia; Skudlik, Christoph ; John, Swen M. ; Geier, Johannes
-The benefit of late readings in patch testing depends both on allergen and patient characteristicsForkel, Susann; Schubert, Steffen; Dickel, Heinrich ; Gina, Michal; Schroeder-Kraft, Claudia; Vieluf, Dieter; Brans, Richard ; Kreft, Burkhard; Wurpts, Gerda; Geier, Johannes; Buhl, Timo
2014Topical ophthalmic agents as allergens in periorbital dermatitisLandeck, Lilla; John, Swen Malte ; Geier, Johannes