| Erscheinungsdatum | Titel | Autor(en) |
| 2012 | Atomic force microscopy - looking at mechanosensors on the cell surface | Heinisch, Juergen J.; Lipke, Peter N.; Beaussart, Audrey; Chatel, Sofiane El Kirat; Dupres, Vincent; Alsteens, David; Dufrene, Yves F. |
| 2011 | Atomic Force Microscopy Demonstrates That Disulfide Bridges Are Required for Clustering of the Yeast Cell Wall Integrity Sensor Wsc1 | Dupres, Vincent; Heinisch, Jurgen J.; Dufrene, Yves F. |
| 2012 | High-Resolution Imaging of Chemical and Biological Sites on Living Cells Using Peak Force Tapping Atomic Force Microscopy | Alsteens, David; Dupres, Vincent; Yunus, Sami; Latge, Jean-Paul; Heinisch, Juergen J.; Dufrene, Yves F. |
| 2010 | Is there anyone out there?-Single-molecule atomic force microscopy meets yeast genetics to study sensor functions | Heinisch, Juergen J.; Dufrene, Yves F. |
| 2010 | Measurement of the mechanical behavior of yeast membrane sensors using single-molecule atomic force microscopy | Heinisch, Juergen J.; Dupres, Vincent; Alsteens, David; Dufrene, Yves F. |
| 2010 | Measuring Cell Wall Thickness in Living Yeast Cells Using Single Molecular Rulers | Dupres, Vincent; Dufrene, Yves F.; Heinisch, Juergen J. |
| 2010 | Single-Molecule Atomic Force Microscopy Reveals Clustering of the Yeast Plasma-Membrane Sensor Wsc1 | Heinisch, Juergen J.; Dupres, Vincent; Wilk, Sabrina; Jendretzki, Arne; Dufrene, Yves F. |
| 2009 | The yeast Wsc1 cell surface sensor behaves like a nanospring in vivo | Dupres, Vincent; Alsteens, David; Wilk, Sabrina; Hansen, Benjamin; Heinisch, Juergen J.; Dufrene, Yves F. |
| 2015 | Up against the Wall: Is Yeast Cell Wall Integrity Ensured by Mechanosensing in Plasma Membrane Microdomains? | Kock, Christian ; Dufrene, Yves F.; Heinisch, Juergen J. |
HOCHSCHULBIBLIOGRAPHIE