Browsing by Subject X ray diffraction, Film preparation
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
|---|---|---|
| 2010 | Structure and stability of cub-Pr2O3 films on Si(111) under post deposition annealing conditions | Gevers, S.; Weisemoeller, T.; Zimmermann, B.; Deiter, C.; Wollschläger, J. |