Element specific surface reconstructions of islands during surfactant-mediated growth on Si(111)
Autor(en): | Antons, A Schroeder, K Voigtlander, B Cherepanov, V Berger, R Blugel, S |
Stichwörter: | DIFFUSION; ENERGY-ELECTRON DIFFRACTION; EPITAXIAL-GROWTH; KINETICS; Physics; Physics, Multidisciplinary; PSEUDOPOTENTIALS; SI | Erscheinungsdatum: | 2002 | Herausgeber: | AMER PHYSICAL SOC | Journal: | PHYSICAL REVIEW LETTERS | Volumen: | 89 | Ausgabe: | 23 | Zusammenfassung: | The early stages of surfactant- (As, Sb) mediated homoepitaxial growth on Si (111) are examined by scanning tunneling microscopy and extensive ab initio calculations of Si-n clusters (nless than or equal to12). The results reveal the different microscopic behavior of the two surfactants: On As-covered Si (111), one exclusively finds two-dimensional islands with double-layer height which show the (1x1) terrace structure. On Sb-covered Si (111), the islands show two different reconstructions: at the rim of the islands a (1x1) structure appears, while in the center the (root3xroot3) terrace structure is observed. |
ISSN: | 00319007 | DOI: | 10.1103/PhysRevLett.89.236101 |
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geprüft am 15.05.2024