Atomic-resolution imaging of clean and hydrogen-terminated C(100)-(2x1) diamond surfaces using noncontact AFM

Autor(en): Nimmrich, M.
Kittelmann, M.
Rahe, P. 
Mayne, A. J.
Dujardin, G. 
von Schmidsfeld, A.
Reichling, M. 
Harneit, W. 
Kuehnle, A.
Stichwörter: AB-INITIO; CONDUCTIVITY; DEFECTS; DESORPTION; Materials Science; Materials Science, Multidisciplinary; Physics; Physics, Applied; Physics, Condensed Matter; SCANNING-TUNNELING-MICROSCOPY; STEPS; STM
Erscheinungsdatum: 2010
Herausgeber: AMER PHYSICAL SOC
Journal: PHYSICAL REVIEW B
Volumen: 81
Ausgabe: 20
Zusammenfassung: 
High-purity, type IIa diamond is investigated by noncontact atomic force microscopy (NC-AFM). We present atomic-resolution images of both the electrically conducting hydrogen-terminated C(100)-(2 x 1) : H surface and the insulating C(100)-(2 x 1) surface. For the hydrogen-terminated surface, a nearly square unit cell is imaged. In contrast to previous scanning tunneling microscopy experiments, NC-AFM imaging allows both hydrogen atoms within the unit cell to be resolved individually, indicating a symmetric dimer alignment. Upon removing the surface hydrogen, the diamond sample becomes insulating. We present atomic-resolution images, revealing individual C-C dimers. Our results provide real-space experimental evidence for a (2 x 1) dimer reconstruction of the truly insulating C(100) surface.
ISSN: 10980121
DOI: 10.1103/PhysRevB.81.201403

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