Dependability Aspects in Configurable Embedded Operating Systems
| Autor(en): | Schirmeier, Horst Borchert, Christoph Hoffmann, Martin Dietrich, Christian Martens, Arthur Kapitza, Rüdiger Lohmann, Daniel Spinczyk, Olaf |
Stichwörter: | Computer science; Fault tolerance; Dependability; Embedded system; Reliability (semiconductor); Reliability engineering; Mixed criticality; Software | Erscheinungsdatum: | 2021 | Herausgeber: | Springer, Cham | Journal: | Embedded systems | Startseite: | 85 | Seitenende: | 116 | ISSN: | 2193-0155 | DOI: | https://doi.org/10.1007/978-3-030-52017-5_4 | Rechte: | cc-by |
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