Vertical and lateral drift corrections of scanning probe microscopy images

Autor(en): Rahe, P. 
Bechstein, R.
Kuehnle, A.
Stichwörter: ATOMIC-FORCE MICROSCOPY; CALIBRATION; COMPENSATION; DIFFUSION; ELIMINATION; Engineering; Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics; Physics, Applied; RECONSTRUCTION; scanning probe microscopy; Science & Technology - Other Topics; STM; TRACKING; TUNNELING-MICROSCOPY
Erscheinungsdatum: 2010
Herausgeber: A V S AMER INST PHYSICS
Journal: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
Volumen: 28
Ausgabe: 3
Zusammenfassung: 
A procedure is presented for image correction of scanning probe microscopy data that is distorted by linear thermal drift. The procedure is based on common ideas for drift correction, which the authors combine to a comprehensive step-by-step description of how to measure drift velocities in all three dimensions and how to correct the images using these velocities. The presented method does not require any knowledge about size or shape of the imaged structures. Thus, it is applicable to any type of scanning probe microscopy image, including images lacking periodic structures. Besides providing a simple, ready-to-use description of lateral and vertical drift correction, they derive all formulas needed from the model of linear drift. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3360909]
ISSN: 21662746
DOI: 10.1116/1.3360909

Show full item record

Page view(s)

6
Last Week
0
Last month
0
checked on Mar 4, 2024

Google ScholarTM

Check

Altmetric