| Erscheinungsdatum | Titel | Autor(en) |
| 1999 | Analysis of XPS valence band spectra of polymers using a density-functional theory based calculation of model oligomers | Mahl, S; Neumann, M; Schneider, B; Schlett, V; Baalmann, A |
| 1998 | Band gap stability in CeRhSb | Slebarski, A; Jezierski, A; Zygmunt, A; Mahl, S; Neumann, M |
| 1997 | Characterisation of the VG ESCALAB instrumental broadening functions by XPS measurements at the Fermi edge of silver | Mahl, S; Neumann, M; Dieckhoff, S; Schlett, V; Baalmann, A |
| 1996 | Effect of alloying on the electronic structure in CeNiSn | Slebarski, A; Jezierski, A; Zygmunt, A; Mahl, S; Neumann, M; Borstel, G |
| 1997 | Electronic structure of CeNi1-xPdxSn and LaMSn (M=Ni,Cu,Pd) | Slebarski, A; Jezierski, A; Mahl, S; Neumann, M; Borstel, G |
| 1998 | Electronic structure of Nd3Co11B4 | Jezierski, A; Kowalczyk, A; Mahl, S; Neumann, M; Borstel, G |
| 1998 | Influence of the Kondo-hole impurities on the electronic structure of CeNiSn and CeRhSb | Slebarski, A; Jezierski, A; Mahl, S; Neumann, H; Borstel, G |
| 1996 | Information about the electronic structure of SrTiO3, BaBiO3 and LiNbO3 deduced from the XPS satellites and their relevance to optical functions | Mayer, B; Mahl, S; Neumann, M |
| 1996 | Innovative methods for a deconvolution of XPS spectra from plasma-oxidized polyethylene | Mahl, S; Lachnitt, J; Niemann, R; Neumann, M; Baalmann, A; Kruse, A; Schlett, V |
| 1998 | Some aspects of the fitting of XPS core spectra of polymers | Mahl, S; Neumann, M; Schlett, V; Baalmann, A |
| 1997 | Spectral noise distortion in photoelectron spectroscopy by acquiring data with multidetector systems | Mahl, S; Neumann, M; Schlett, V; Baalmann, A |
| 1998 | Spin and valence fluctuations in CeMn4Al8 and CeMn6Al6 | Coldea, M; Neumann, M; Lutkehoff, S; Mahl, S; Coldea, R |
| 1998 | Suppression of the gap energy in Zr-Ni-Sn and Ti-Ni-Sn by partial substitution of Zr and Ti by Ce | Slebarski, A; Jezierski, A; Zygmunt, A; Mahl, S; Neumann, M |
| 1996 | The crystallographic, magnetic and electronic properties of RM(2)X(2) (R=La, Ce, Pr; M=Cu, Ni; X=Sn, Sb) | Slebarski, A; Jezierski, A; Zygmunt, A; Neumann, M; Mahl, S; Borstel, G |
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