Showing results 35611 to 35630 of 36074
< previous
next >
Issue Date | Title | Author(s) |
1994 | X-RAY PHOTOEMISSION SPECTRA MEASUREMENTS OF CENI2SB2 AND CECU2SB2 | SLEBARSKI, A; NEUMANN, M; MAHL, S; PIERRE, J; KACZMARSKA, K |
1997 | X-ray photoemission spectra of Dy(Co1-xAlx)(2) systems | Szajek, A; Jezierski, A; Kowalczyk, A; Baszynski, J; Bartkowski, S; Neumann, M; Borstel, G |
2005 | X-ray photoemission study of yttrium contained in radiotherapy systems | Simon, V; Eniu, D; Takacs, A; Magyari, K; Neumann, M; Simon, S |
2008 | X-ray spectroscopic and magnetic investigation of C : Ni nanocomposite films grown by ion beam cosputtering | Abrasonis, G.; Scheinost, A. C.; Zhou, S.; Torres, R.; Gago, R.; Jimenez, I.; Kuepper, K.; Potzger, K.; Krause, M.; Kolitsch, A.; Moeller, W.; Bartkowski, S.; Neumann, M.; Gareev, R. R. |
2009 | X-ray spectroscopic and magnetic investigations of selected manganese-containing molecular high spin complexes | Prinz, Manuel |
2009 | X-ray spectroscopic techniques are powerful tools for electronic structure investigations of transition metal oxides | Neumann, M.; Kueppera, K. |
2008 | X-RAY SPECTROSCOPY OF LANTHANUM MANGANITES: NATURE OF DOPING HOLES, CORRELATION EFFECTS, AND ORBITAL ORDERING | Galakhov, V. R.; Falub, M. C.; Kuepper, K.; Neumann, M. |
1972 | X-Ray Structure Analysis of a Benzocyclopropene Derivative | Carstensen‐Oeser, Ernst; Müller, Berthold; Dürr, Heinz |
1995 | X-RAY-EMISSION, PHOTOELECTRON-SPECTRA, AND ELECTRONIC-STRUCTURE OF SR2CUO2F2+DELTA | KURMAEV, EZ; GALAKHOV, VR; FEDORENKO, VV; ELOKHINA, LV; BARTKOWSKI, S; NEUMANN, M; GREAVES, C; EDWARDS, PP; ALMAMOURI, M; NOVIKOV, DL |
2001 | X-ray-induced photochromic effects in copper-doped lithium niobate crystals | Berben, D; Andreas, B; Buse, K |
1988 | X-RAY-SCATTERING FACTORS OF CRYSTALLINE SILICON AND GERMANIUM FROM A BOND CHARGE MODEL | BALBAS, LC; RUBIO, A; ALONSO, JA; MARCH, NH; BORSTEL, G |
2016 | X20CoCrWMo10-9//Co3O4: a metal-ceramic composite with unique efficiency values for water-splitting in the neutral regime | Schaefer, Helmut; Chevrier, Daniel M.; Kuepper, Karsten ; Zhang, Peng; Wollschlaeger, Joachim ; Daum, Diemo; Steinhart, Martin ; Hess, Claudia; Krupp, Ulrich; Mueller-Buschbaum, Klaus; Stangl, Johannes; Schmidt, Mercedes |
1993 | xc - die UIL für das X Window System | Bischof, Hans-Peter |
2016 | XDAI-A: Framework for Enabling Cross-Device Integration of Android Apps | Wolters, Dennis; Kirchhoff, Jonas; Gerth, Christian; Engels, Gregor |
1991 | XE-ADLAYERS ON PT(111) AND PD(111) - STRUCTURE INVESTIGATION BY SPIN-POLARIZED LEED | HILGERS, G; POTTHOFF, M; WIRTH, S; MULLER, N; HEINZMANN, U; HAUNERT, L; BRAUN, J; BORSTEL, G |
2009 | XML-based DEVS modeling and interpretation | Meseth, N.; Kirchhof, P.; Witte, T. |
2009 | XML-based DEVS modeling and interpretation | Meseth, N.; Kirchhof, P.; Witte, T. |
2009 | XML-based DEVS modeling and interpretation | Meseth, Nicolas; Kirchhof, Patrick; Witte, Thomas |
2019 | XPlatoon – Simulation und Prototypisierung eines Vermittlermodells für LKW-Platooning | Krüger, Nicolai; Teuteberg, Frank |
2017 | XPS and morphological properties of Cr2O3 thin films grown by thermal evaporation method | Kadari, Ahmed; Schemme, Tobias ; Kadri, Dahane; Wollschlaeger, Joachim |