Bertram, Florian
Full Name
Bertram, Florian
Variants
Bertram, F
Bertram, Florian
Bertram, Florian
Main Affiliation
FIS NetID
ORCID
Country
Germany
Lädt ...
2
0
20
0
false
Lädt ...
3
0
20
0
false
Typ
1-6 von 6
Erscheinungsdatum | Titel | Autor(en) | |
---|---|---|---|
1 | 2008 | Epitaxy of single crystalline PrO2 films on Si(111) | Weisemoeller, T.; Deiter, C.; Bertram, F. ; Gevers, S.; Giussani, A.; Zaumseil, P.; Schroeder, T.; Wollschlaeger, J. |
2 | 2009 | Erratum: Epitaxial growth of Bi(111) on Si(001) (e-Journal of Surface Science and Nanotechnology (2009) 7 (441-447)) | Jnawali, G.; Hattab, H.; Bobisch, C.A.; Bernhart, A.; Krenzer, B.; Zubkov, E.; Deiter, C.; Weisemoeller, T.; Bertram, F. ; Wollschläger, J. ; Möller, R.; Horn-Von Hoegen, M. |
3 | 2009 | Epitaxial growth of Bi(111) on Si(001) | Jnawali, G.; Hattab, H.; Bobisch, C.A.; Bernhart, A.; Zubkov, E.; Deiter, C.; Weisemoeller, T.; Bertram, F. ; Wollschl̈ager, J. ; M̈oller, R.; Hoegen, M.H.-V. |
4 | 2009 | Effect of amorphous interface layers on crystalline thin-film x-ray diffraction | Weisemoeller, T.; Bertram, F. ; Gevers, S.; Deiter, C.; Greuling, A.; Wollschlaeger, J. |
5 | 2009 | Structural phase transition of ultra thin PrO2 films on Si(111) | Gevers, S.; Weisemoeller, T.; Zimmermann, B.; Bertram, F. ; Deiter, C.; Wollschlaeger, J. |
6 | 2009 | Postdeposition annealing induced transition from hexagonal Pr2O3 to cubic PrO2 films on Si(111) | Weisemoeller, T.; Bertram, F. ; Gevers, S.; Greuling, A.; Deiter, C.; Tobergte, H.; Neumann, M.; Wollschlaeger, J.; Giussani, A.; Schroeder, T. |