Bertram, Florian

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Full Name
Bertram, Florian
 
Variants
Bertram, F
Bertram, Florian
 
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Country
Germany
 
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Publications


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Person:  Deiter, C.

1-9 von 9

ErscheinungsdatumTitelAutor(en)
12008Epitaxy of single crystalline PrO2 films on Si(111)Weisemoeller, T.; Deiter, C.; Bertram, F. ; Gevers, S.; Giussani, A.; Zaumseil, P.; Schroeder, T.; Wollschlaeger, J.
22009Erratum: Epitaxial growth of Bi(111) on Si(001) (e-Journal of Surface Science and Nanotechnology (2009) 7 (441-447))Jnawali, G.; Hattab, H.; Bobisch, C.A.; Bernhart, A.; Krenzer, B.; Zubkov, E.; Deiter, C.; Weisemoeller, T.; Bertram, F. ; Wollschläger, J. ; Möller, R.; Horn-Von Hoegen, M.
32009Epitaxial growth of Bi(111) on Si(001)Jnawali, G.; Hattab, H.; Bobisch, C.A.; Bernhart, A.; Zubkov, E.; Deiter, C.; Weisemoeller, T.; Bertram, F. ; Wollschl̈ager, J. ; M̈oller, R.; Hoegen, M.H.-V.
42009Effect of amorphous interface layers on crystalline thin-film x-ray diffractionWeisemoeller, T.; Bertram, F. ; Gevers, S.; Deiter, C.; Greuling, A.; Wollschlaeger, J.
52009Structural phase transition of ultra thin PrO2 films on Si(111)Gevers, S.; Weisemoeller, T.; Zimmermann, B.; Bertram, F. ; Deiter, C.; Wollschlaeger, J.
62009Postdeposition annealing induced transition from hexagonal Pr2O3 to cubic PrO2 films on Si(111)Weisemoeller, T.; Bertram, F. ; Gevers, S.; Greuling, A.; Deiter, C.; Tobergte, H.; Neumann, M.; Wollschlaeger, J.; Giussani, A.; Schroeder, T.
72011In-situ x-ray diffraction studies on post-deposition vacuum-annealing of ultra-thin iron oxide filmsBertram, F. ; Deiter, C.; Pflaum, K.; Suendorf, M.; Otte, C.; Wollschlaeger, J.
82012X-ray diffraction study on size effects in epitaxial magnetite thin films on MgO(001)Bertram, F. ; Deiter, C.; Hoefert, O.; Schemme, T. ; Timmer, F.; Suendorf, M.; Zimmermann, B.; Wollschlaeger, J.
92013Reordering between tetrahedral and octahedral sites in ultrathin magnetite films grown on MgO(001)Bertram, F. ; Deiter, C.; Schemme, T. ; Jentsch, S.; Wollschlaeger, J.