Reichling, Michael

Profile

Full Name
Reichling, Michael
 
Variants
Reichling, M
Reichling, Michael
 
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Country
Germany
 
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Publications


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Schlagwort:  Instruments & Instrumentation

1-8 von 8

ErscheinungsdatumTitelAutor(en)
12008Improvement of a dynamic scanning force microscope for highest resolution imaging in ultrahigh vacuumTorbruegge, S.; Luebbe, J.; Troeger, L.; Cranney, M.; Eguchi, T.; Hasegawa, Y.; Reichling, M. 
22009Concept for support and cleavage of brittle crystalsTroeger, L.; Schuette, J.; Ostendorf, F.; Kuehnle, A.; Reichling, M. 
32010Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopyLuebbe, Jannis; Troeger, Lutz; Torbruegge, Stefan; Bechstein, Ralf; Richter, Christoph; Kuehnle, Angelika; Reichling, Michael 
42011Measurement and modelling of non-contact atomic force microscope cantilever properties from ultra-high vacuum to normal pressure conditionsLuebbe, Jannis; Temmen, Matthias; Schnieder, Holger; Reichling, Michael 
52011Flexible drift-compensation system for precise 3D force mapping in severe drift environmentsRahe, Philipp ; Schuette, Jens; Schniederberend, Werner; Reichling, Michael ; Abe, Masayuki; Sugimoto, Yoshiaki; Kuehnle, Angelika
62012Versatile system for the temperature-controlled preparation of oxide crystal surfacesPieper, H. H.; Lammers, C.; Troeger, L.; Bahr, S.; Reichling, M. 
72012Precise determination of force microscopy cantilever stiffness from dimensions and eigenfrequenciesLuebbe, Jannis; Doering, Lutz; Reichling, Michael 
82013Concept for support and heating of plate-like samples in the ultra-high vacuumTroeger, L.; Pieper, H. H.; Reichling, M.