Reichling, Michael
Full Name
Reichling, Michael
Variants
Reichling, M
Reichling, Michael
Reichling, Michael
Main Affiliation
FIS NetID
ORCID
Country
Germany
Lädt ...
2
0
20
0
false
Lädt ...
3
0
20
0
false
Typ
1-7 von 7
| Erscheinungsdatum | Titel | Autor(en) | |
|---|---|---|---|
| 1 | 2010 | Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy | Luebbe, Jannis; Troeger, Lutz; Torbruegge, Stefan; Bechstein, Ralf; Richter, Christoph; Kuehnle, Angelika; Reichling, Michael |
| 2 | 2010 | Quantitative description of C-60 diffusion on an insulating surface | Loske, Felix; Luebbe, Jannis; Schuette, Jens; Reichling, Michael ; Kuehnle, Angelika |
| 3 | 2011 | Measurement and modelling of non-contact atomic force microscope cantilever properties from ultra-high vacuum to normal pressure conditions | Luebbe, Jannis; Temmen, Matthias; Schnieder, Holger; Reichling, Michael |
| 4 | 2012 | Precise determination of force microscopy cantilever stiffness from dimensions and eigenfrequencies | Luebbe, Jannis; Doering, Lutz; Reichling, Michael |
| 5 | 2013 | Determining cantilever stiffness from thermal noise | Luebbe, Jannis; Temmen, Matthias; Rahe, Philipp ; Kuehnle, Angelika; Reichling, Michael |
| 6 | 2013 | Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy | Luebbe, Jannis; Temmen, Matthias; Rode, Sebastian; Rahe, Philipp ; Kuehnle, Angelika; Reichling, Michael |
| 7 | 2016 | Noise in NC-AFM measurements with significant tip-sample interaction | Luebbe, Jannis; Temmen, Matthias; Rahe, Philipp ; Reichling, Michael |