Hole-doping of mechanically exfoliated graphene by confined hydration layers

Autor(en): Bollmann, Tjeerd R. J.
Antipina, Liubov Yu.
Temmen, Matthias
Reichling, Michael 
Sorokin, Pavel B.
Stichwörter: AMBIENT CONDITIONS; ATOMIC-FORCE MICROSCOPY; Chemistry; Chemistry, Physical; electronic transport in nanoscale materials and structures; graphene; INITIO MOLECULAR-DYNAMICS; liquid-solid interface structure; Materials Science; Materials Science, Multidisciplinary; MICA; Nanoscience & Nanotechnology; non-contact atomic force microscopy (NC-AFM, KPFM); Physics; Physics, Applied; RAMAN-SPECTROSCOPY; Science & Technology - Other Topics; SUBSTRATE; WATER
Erscheinungsdatum: 2015
Herausgeber: TSINGHUA UNIV PRESS
Journal: NANO RESEARCH
Volumen: 8
Ausgabe: 9
Startseite: 3020
Seitenende: 3026
Zusammenfassung: 
By the use of non-contact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM), we measure the local surface potential of mechanically exfoliated graphene on the prototypical insulating hydrophilic substrate of CaF2(111). Hydration layers confined between the graphene and the CaF2 substrate, resulting from the graphene's preparation under ambient conditions on the hydrophilic substrate surface, are found to electronically modify the graphene as the material's electron density transfers from graphene to the hydration layer. Density functional theory (DFT) calculations predict that the first 2 to 3 water layers adjacent to the graphene hole-dope the graphene by several percent of a unit charge per unit cell.
ISSN: 19980124
DOI: 10.1007/s12274-015-0807-x

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