Investigating atomic details of the CaF2 (111) surface with a qPlus sensor

Autor(en): Giessibl, FJ
Reichling, M 
Stichwörter: CANTILEVERS; DYNAMIC FORCE MICROSCOPY; EPITAXY; Materials Science; Materials Science, Multidisciplinary; Nanoscience & Nanotechnology; Physics; Physics, Applied; RESOLUTION; Science & Technology - Other Topics; STABILITY
Erscheinungsdatum: 2005
Herausgeber: IOP PUBLISHING LTD
Journal: NANOTECHNOLOGY
Volumen: 16
Ausgabe: 3, SI
Startseite: S118-S124
Zusammenfassung: 
The (111) surface of CaF2 has been intensively studied with large-amplitude frequency-modulation atomic force microscopy, and the atomic contrast formation is now well understood. It has been shown that the apparent contrast patterns obtained with a polar tip strongly depend on the tip terminating ion, and three sub-lattices of anions and cations can be imaged. Here, we study the details of atomic contrast formation on CaF2 (111) with small-amplitude force microscopy utilizing the qPlus sensor that has been shown to provide the utmost resolution at high scanning stability. Step edges resulting from cleaving crystals in situ in the ultra-high vacuum appear as very sharp structures, and on flat terraces the atomic corrugation is seen in high clarity even for large area scans. The atomic structure is also not lost when scanning across triple layer step edges. High-resolution scans of small surface areas yield contrast features of anion- and cation sub-lattices with unprecedented resolution. These contrast patterns are related to previously reported theoretical results.
Beschreibung: 
7th International Conference on Non-contact Atomic Force Microscopy, Seattle, WA, SEP 12-15, 2004
ISSN: 09574484
DOI: 10.1088/0957-4484/16/3/022

Show full item record

Page view(s)

1
Last Week
1
Last month
0
checked on Feb 29, 2024

Google ScholarTM

Check

Altmetric