Auflistung: nach Autor Temmen, Matthias
1 bis 7 von 7 Treffer
| Erscheinungsdatum | Titel | Autor(en) |
|---|---|---|
| 2016 | Abbildung von Graphen und CaF2(111) mittels hochauflösender Nicht-Kontakt-Rasterkraftmikroskopie | Temmen, Matthias |
| 2013 | Determining cantilever stiffness from thermal noise | Luebbe, Jannis; Temmen, Matthias; Rahe, Philipp ; Kuehnle, Angelika; Reichling, Michael |
| 2015 | Hole-doping of mechanically exfoliated graphene by confined hydration layers | Bollmann, Tjeerd R. J.; Antipina, Liubov Yu.; Temmen, Matthias; Reichling, Michael ; Sorokin, Pavel B. |
| 2011 | Measurement and modelling of non-contact atomic force microscope cantilever properties from ultra-high vacuum to normal pressure conditions | Luebbe, Jannis; Temmen, Matthias; Schnieder, Holger; Reichling, Michael |
| 2016 | Noise in NC-AFM measurements with significant tip-sample interaction | Luebbe, Jannis; Temmen, Matthias; Rahe, Philipp ; Reichling, Michael |
| 2013 | Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy | Luebbe, Jannis; Temmen, Matthias; Rode, Sebastian; Rahe, Philipp ; Kuehnle, Angelika; Reichling, Michael |
| 2016 | Understanding interferometry for micro-cantilever displacement detection | von Schmidsfeld, Alexander; Noerenberg, Tobias; Temmen, Matthias; Reichling, Michael |