Browsing by Author Temmen, Matthias

Showing results 1 to 7 of 7
Issue DateTitleAuthor(s)
2016Abbildung von Graphen und CaF2(111) mittels hochauflösender Nicht-Kontakt-RasterkraftmikroskopieTemmen, Matthias
2013Determining cantilever stiffness from thermal noiseLuebbe, Jannis; Temmen, Matthias; Rahe, Philipp ; Kuehnle, Angelika; Reichling, Michael 
2015Hole-doping of mechanically exfoliated graphene by confined hydration layersBollmann, Tjeerd R. J.; Antipina, Liubov Yu.; Temmen, Matthias; Reichling, Michael ; Sorokin, Pavel B.
2011Measurement and modelling of non-contact atomic force microscope cantilever properties from ultra-high vacuum to normal pressure conditionsLuebbe, Jannis; Temmen, Matthias; Schnieder, Holger; Reichling, Michael 
2016Noise in NC-AFM measurements with significant tip-sample interactionLuebbe, Jannis; Temmen, Matthias; Rahe, Philipp ; Reichling, Michael 
2013Thermal noise limit for ultra-high vacuum noncontact atomic force microscopyLuebbe, Jannis; Temmen, Matthias; Rode, Sebastian; Rahe, Philipp ; Kuehnle, Angelika; Reichling, Michael 
2016Understanding interferometry for micro-cantilever displacement detectionvon Schmidsfeld, Alexander; Noerenberg, Tobias; Temmen, Matthias; Reichling, Michael