A perfectly stoichiometric and flat CeO2(111) surface on a bulk-like ceria film

Autor(en): Barth, C.
Laffon, C.
Olbrich, R.
Ranguis, A.
Parent, Ph.
Reichling, M. 
Stichwörter: CATALYSIS; CEO2 BUFFER LAYERS; CHEMISTRY; DEFECT STRUCTURE; MORPHOLOGY; Multidisciplinary Sciences; OXIDE; RAY PHOTOELECTRON-SPECTROSCOPY; SAPPHIRE; SCANNING-TUNNELING-MICROSCOPY; Science & Technology - Other Topics; YBA2CU3O7-DELTA FILMS
Erscheinungsdatum: 2016
Herausgeber: NATURE PUBLISHING GROUP
Journal: SCIENTIFIC REPORTS
Volumen: 6
Zusammenfassung: 
In surface science and model catalysis, cerium oxide (ceria) is mostly grown as an ultra-thin film on a metal substrate in the ultra-high vacuum to understand fundamental mechanisms involved in diverse surface chemistry processes. However, such ultra-thin films do not have the contribution of a bulk ceria underneath, which is currently discussed to have a high impact on in particular surface redox processes. Here, we present a fully oxidized ceria thick film (180 nm) with a perfectly stoichiometric CeO2(111) surface exhibiting exceptionally large, atomically flat terraces. The film is well-suited for ceria model studies as well as a perfect substitute for CeO2 bulk material.
ISSN: 20452322
DOI: 10.1038/srep21165

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