A perfectly stoichiometric and flat CeO2(111) surface on a bulk-like ceria film
Autor(en): | Barth, C. Laffon, C. Olbrich, R. Ranguis, A. Parent, Ph. Reichling, M. |
Stichwörter: | CATALYSIS; CEO2 BUFFER LAYERS; CHEMISTRY; DEFECT STRUCTURE; MORPHOLOGY; Multidisciplinary Sciences; OXIDE; RAY PHOTOELECTRON-SPECTROSCOPY; SAPPHIRE; SCANNING-TUNNELING-MICROSCOPY; Science & Technology - Other Topics; YBA2CU3O7-DELTA FILMS | Erscheinungsdatum: | 2016 | Herausgeber: | NATURE PUBLISHING GROUP | Journal: | SCIENTIFIC REPORTS | Volumen: | 6 | Zusammenfassung: | In surface science and model catalysis, cerium oxide (ceria) is mostly grown as an ultra-thin film on a metal substrate in the ultra-high vacuum to understand fundamental mechanisms involved in diverse surface chemistry processes. However, such ultra-thin films do not have the contribution of a bulk ceria underneath, which is currently discussed to have a high impact on in particular surface redox processes. Here, we present a fully oxidized ceria thick film (180 nm) with a perfectly stoichiometric CeO2(111) surface exhibiting exceptionally large, atomically flat terraces. The film is well-suited for ceria model studies as well as a perfect substitute for CeO2 bulk material. |
ISSN: | 20452322 | DOI: | 10.1038/srep21165 |
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geprüft am 19.05.2024