Auflistung: nach Autor Deiter, C.
1 bis 14 von 14 Treffer
| Erscheinungsdatum | Titel | Autor(en) |
|---|---|---|
| 2009 | Effect of amorphous interface layers on crystalline thin-film x-ray diffraction | Weisemoeller, T.; Bertram, F. ; Gevers, S.; Deiter, C.; Greuling, A.; Wollschlaeger, J. |
| 2009 | Epitaxial growth of Bi(111) on Si(001) | Jnawali, G.; Hattab, H.; Bobisch, C.A.; Bernhart, A.; Zubkov, E.; Deiter, C.; Weisemoeller, T.; Bertram, F. ; Wollschl̈ager, J. ; M̈oller, R.; Hoegen, M.H.-V. |
| 2008 | Epitaxy of single crystalline PrO2 films on Si(111) | Weisemoeller, T.; Deiter, C.; Bertram, F. ; Gevers, S.; Giussani, A.; Zaumseil, P.; Schroeder, T.; Wollschlaeger, J. |
| 2009 | Erratum: Epitaxial growth of Bi(111) on Si(001) (e-Journal of Surface Science and Nanotechnology (2009) 7 (441-447)) | Jnawali, G.; Hattab, H.; Bobisch, C.A.; Bernhart, A.; Krenzer, B.; Zubkov, E.; Deiter, C.; Weisemoeller, T.; Bertram, F. ; Wollschläger, J. ; Möller, R.; Horn-Von Hoegen, M. |
| 2006 | Homogeneous Si films on CaF2/Si(111) due to boron enhanced solid phase epitaxy | Wollschlaeger, J.; Deiter, C.; Bierkandt, M.; Gerdes, A.; Baeumer, M.; Wang, C. R.; Mueller, B. H.; Hofmann, K. R. |
| 2011 | In-situ x-ray diffraction studies on post-deposition vacuum-annealing of ultra-thin iron oxide films | Bertram, F. ; Deiter, C.; Pflaum, K.; Suendorf, M.; Otte, C.; Wollschlaeger, J. |
| 2009 | Postdeposition annealing induced transition from hexagonal Pr2O3 to cubic PrO2 films on Si(111) | Weisemoeller, T.; Bertram, F. ; Gevers, S.; Greuling, A.; Deiter, C.; Tobergte, H.; Neumann, M.; Wollschlaeger, J.; Giussani, A.; Schroeder, T. |
| 2013 | Reordering between tetrahedral and octahedral sites in ultrathin magnetite films grown on MgO(001) | Bertram, F. ; Deiter, C.; Schemme, T. ; Jentsch, S.; Wollschlaeger, J. |
| 2007 | Solid phase epitaxy of Ge films on CaF2/Si(111) | Rugeramigabo, E. P.; Deiter, C.; Wollschlaeger, J. |
| 2009 | Structural phase transition of ultra thin PrO2 films on Si(111) | Gevers, S.; Weisemoeller, T.; Zimmermann, B.; Bertram, F. ; Deiter, C.; Wollschlaeger, J. |
| 2010 | Structure and stability of cub-Pr2O3 films on Si(111) under post deposition annealing conditions | Gevers, S.; Weisemoeller, T.; Zimmermann, B.; Deiter, C.; Wollschläger, J. |
| 2011 | Surfactant enhanced solid phase epitaxy of Ge/CaF2/Si(111): Synchrotron x-ray characterization of structure and morphology | Wollschlaeger, J.; Deiter, C.; Wang, C. R.; Mueller, B. H.; Hofmann, K. R. |
| 2008 | The influence of lattice oxygen on the initial growth behavior of heteroepitaxial Ge layers on single crystalline PrO2(111)/Si(111) support systems | Giussani, A.; Seifarth, O.; Rodenbach, P.; Muessig, H.-J.; Zaumseil, P.; Weisemoeller, T.; Deiter, C.; Wollschlaeger, J.; Storck, P.; Schroeder, T. |
| 2012 | X-ray diffraction study on size effects in epitaxial magnetite thin films on MgO(001) | Bertram, F. ; Deiter, C.; Hoefert, O.; Schemme, T. ; Timmer, F.; Suendorf, M.; Zimmermann, B.; Wollschlaeger, J. |