Reichling, Michael

Full Name
Reichling, Michael
 
Variants
Reichling, M
Reichling, Michael
 
Main Affiliation
 
FIS NetID
 
 
Country
Germany
 
Lädt ... 2 0 20 0 false
 
Lädt ... 3 0 20 0 false
 

Publications

21-40 von 87

ErscheinungsdatumTitelAutor(en)
212008Morphology, Dispersion, and Stability of Cu Nanoclusters on Clean and Hydroxylated (alpha-Al2O3(0001) SubstratesJensen, M. C. R.; Venkataramani, K.; Helveg, S.; Clausen, B. S.; Reichling, M. ; Besenbacher, F.; Lauritsen, J. V.
222008Improvement of a dynamic scanning force microscope for highest resolution imaging in ultrahigh vacuumTorbruegge, S.; Luebbe, J.; Troeger, L.; Cranney, M.; Eguchi, T.; Hasegawa, Y.; Reichling, M. 
232008How flat is an air-cleaved mica surface?Ostendorf, F.; Schmitz, C.; Hirth, S.; Kuehnle, A.; Kolodziej, J. J.; Reichling, M. 
242009High resolution study of etch figures on CaF2 (111)Motzer, Christian; Reichling, Michael 
252009Atomic Manipulation on an Insulator SurfaceHirth, Sabine; Ostendorf, Frank; Reichling, Michael 
262009Stabilization of Zinc-Terminated ZnO(0001) by a Modified Surface StoichiometryTorbruegge, Stefan; Ostendorf, Frank; Reichling, Michael 
272009Concept for support and cleavage of brittle crystalsTroeger, L.; Schuette, J.; Ostendorf, F.; Kuehnle, A.; Reichling, M. 
282009Growth of ordered C-60 islands on TiO2(110)Loske, Felix; Bechstein, Ralf; Schuette, Jens; Ostendorf, Frank; Reichling, Michael ; Kuehnle, Angelika
292009Evidence for Potassium Carbonate Crystallites on Air-Cleaved Mica SurfacesOstendorf, Frank; Schmitz, Carsten; Hirth, Sabine; Kuehnle, Angelika; Kolodziej, Jacek J.; Reichling, Michael 
302009Impurities in synthetic fluorite for deep ultraviolet optical applicationsSils, J.; Hausfeld, S.; Clauss, W.; Pahl, U.; Lindner, R.; Reichling, M. 
312009Cooperative mechanism for anchoring highly polar molecules at an ionic surfaceSchuette, J.; Bechstein, R.; Rohlfing, M.; Reichling, M. ; Kuehnle, A.
322010Ordering of monodisperse Ni nanoclusters by templating on high-temperature reconstructed alpha-Al2O3(0001)Venkataramani, K.; Helveg, S.; Hinnemann, B.; Reichling, M. ; Besenbacher, F.; Lauritsen, J. V.
332010Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopyLuebbe, Jannis; Troeger, Lutz; Torbruegge, Stefan; Bechstein, Ralf; Richter, Christoph; Kuehnle, Angelika; Reichling, Michael 
342010Clear Signature of the (2 x 1) Reconstruction of Calcite (10(1)over-bar4)Schuette, Jens; Rahe, Philipp ; Troeger, Lutz; Rode, Sebastian; Bechstein, Ralf; Reichling, Michael ; Kuehnle, Angelika
352010Quantitative description of C-60 diffusion on an insulating surfaceLoske, Felix; Luebbe, Jannis; Schuette, Jens; Reichling, Michael ; Kuehnle, Angelika
362010Atomic-resolution imaging of clean and hydrogen-terminated C(100)-(2x1) diamond surfaces using noncontact AFMNimmrich, M.; Kittelmann, M.; Rahe, P. ; Mayne, A. J.; Dujardin, G. ; von Schmidsfeld, A.; Reichling, M. ; Harneit, W. ; Kuehnle, A.
372010Unravelling the atomic structure of cross-linked (1 x 2) TiO2(110)Pieper, Hans Hermann; Venkataramani, Krithika; Torbruegge, Stefan; Bahr, Stephan; Lauritsen, Jeppe V.; Besenbacher, Flemming; Kuehnle, Angelika; Reichling, Michael 
382010Quantification of antagonistic optomechanical forces in an interferometric detection system for dynamic force microscopyTroeger, L.; Reichling, M. 
392010Morphological classification and quantitative analysis of etch pitsMotzer, C.; Reichling, M. 
402010Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tipsArai, T.; Gritschneder, S.; Troeger, L.; Reichling, M.