Erscheinungsdatum | Titel | Autor(en) |
2015 | A diamond (100) surface with perfect phase purity | Dyachenko, Oleksiy ; Diek, Nadine ; Shapiro, Yevgeniy ; Tamang, Rajesh ; Harneit, Wolfgang ; Reichling, Michael ; Borodin, Andriy |
2016 | A perfectly stoichiometric and flat CeO2(111) surface on a bulk-like ceria film | Barth, C.; Laffon, C.; Olbrich, R.; Ranguis, A.; Parent, Ph.; Reichling, M. |
2014 | A well-structured metastable ceria surface | Olbrich, R.; Pieper, H. H.; Oelke, R.; Wilkens, H. ; Wollschlaeger, J.; Zoellner, M. H.; Schroeder, T.; Reichling, M. |
2010 | Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy | Luebbe, Jannis; Troeger, Lutz; Torbruegge, Stefan; Bechstein, Ralf; Richter, Christoph; Kuehnle, Angelika; Reichling, Michael |
2012 | Al2O3(11(2)over-bar0) surface as a template for the ordered growth of Ni and Co nanoclusters | Venkataramani, Krithika; Jensen, Thomas N.; Helveg, Stig; Reichling, Michael ; Besenbacher, Flemming; Lauritsen, Jeppe V. |
2021 | Alignment method for the accurate and precise quantification of tip-surface forces | Heile, Daniel; Olbrich, Reinhard; Reichling, Michael ; Rahe, Philipp |
2009 | Atomic Manipulation on an Insulator Surface | Hirth, Sabine; Ostendorf, Frank; Reichling, Michael |
2010 | Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips | Arai, T.; Gritschneder, S.; Troeger, L.; Reichling, M. |
2008 | Atomic resolution Imaging on CeO2(111) with hydroxylated probes | Gritschneder, Sebastian; Reichling, Michael |
2010 | Atomic resolution non-contact atomic force microscopy of clean metal oxide surfaces | Lauritsen, J. V.; Reichling, M. |
2008 | Atomic scale evidence for faceting stabilization of a polar oxide surface | Ostendorf, Frank; Torbruegge, Stefan; Reichling, Michael |
2007 | Atomic structure of a stripe phase on Al2O3/Ni3Al(111) revealed by scanning force microscopy | Gritschneder, Sebastian; Degen, Stefan; Becker, Conrad; Wandelt, Klaus; Reichling, Michael |
2010 | Atomic-resolution imaging of clean and hydrogen-terminated C(100)-(2x1) diamond surfaces using noncontact AFM | Nimmrich, M.; Kittelmann, M.; Rahe, P. ; Mayne, A. J.; Dujardin, G. ; von Schmidsfeld, A.; Reichling, M. ; Harneit, W. ; Kuehnle, A. |
2019 | Capillary force-induced superlattice variation atop a nanometer-wide graphene flake and its moire origin studied by STM | Thomas, Loji K.; Reichling, Michael |
2019 | Capillary force-induced superlattice variation atop a nanometer-wide graphene flake and its moiré origin studied by STM | Thomas, L.K.; Reichling, M. |
2004 | Carbon tips as sensitive detectors for nanoscale surface and sub-surface charge | Arai, T; Gritschneder, S; Troger, L; Reichling, M |
2015 | Ceria at a closer look - reducibility traced down to the atomic scale | Reichling, Michael |
2007 | Characterisation of oxygen defects in calciumdifluoride | Sils, Janis; Radzhabov, Evgeny; Reichling, Michael |
2012 | Characterization of atomic step structures on CaF2(111) by their electric potential | Pieper, H. H.; Barth, C.; Reichling, M. |
2011 | Characterizing TiO2(110) surface states by their work function | Borodin, Andriy ; Reichling, Michael |