Auflistung: nach Autor Wilkens, Henrik

1 bis 15 von 15 Treffer
ErscheinungsdatumTitelAutor(en)
2014A well-structured metastable ceria surfaceOlbrich, R.; Pieper, H. H.; Oelke, R.; Wilkens, H. ; Wollschlaeger, J.; Zoellner, M. H.; Schroeder, T.; Reichling, M. 
2015Controlling the physics and chemistry of binary and ternary praseodymium and cerium oxide systemsNiu, Gang; Zoellner, Marvin Hartwig; Schroeder, Thomas; Schaefer, Andreas; Jhang, Jin-Hao; Zielasek, Volkmar; Baeumer, Marcus; Wilkens, Henrik ; Wollschlaeger, Joachim ; Olbrich, Reinhard; Lammers, Christian; Reichling, Michael 
2011Der Lernstandort in Vrees: Der Lernstandort in Vrees : BodenBildung - Vernetzung - BodenKommunikationGeyer, Karin; Brauckmann, Hans-Jörg ; Broll, Gabriele ; Kleene, H.; Wilken, H. 
1994Nucleotide-induced conformational changes of MalK, a bacterial ATP binding cassette transporter protein.Schneider, Erwin ; Wilken, S ; Schmid, Roland
2014Oxygen Vacancy Induced Room Temperature Ferromagnetism in Pr-Doped CeO2 Thin Films on SiliconNiu, Gang; Hildebrandt, Erwin; Schubert, Markus Andreas; Boscherini, Federico; Zoellner, Marvin Hartwig; Alff, Lambert; Walczyk, Damian; Zaumseil, Peter; Costina, Ioan; Wilkens, Henrik ; Schroeder, Thomas
2014Phase transitions of rare earth oxide films grown on Si(111)Wilkens, Henrik 
2015Plasma Enhanced Complete Oxidation of Ultrathin Epitaxial Praseodymia Films on Si(111)Kuschel, Olga ; Dieck, Florian; Wilkens, Henrik ; Gevers, Sebastian; Rodewald, Jari ; Otte, Christian; Zoellner, Marvin Hartwig; Niu, Gang; Schroeder, Thomas; Wollschlaeger, Joachim 
2015Post deposition annealing of epitaxial Ce1-xPrxO2-delta films grown on Si(111)Wilkens, H. ; Spiess, W.; Zoellner, M. H.; Niu, G.; Schroeder, T.; Wollschlaeger, J.
2013Stabilization of the ceria i-phase (Ce7O12) surface on Si(111)Wilkens, H. ; Schuckmann, O.; Oelke, R.; Gevers, S.; Schaefer, A.; Baeumer, M.; Zoellner, M. H.; Schroeder, T.; Wollschlaeger, J.
2012Stacking behavior of twin-free type-B oriented CeO2(111) films on hexagonal Pr2O3(0001)/Si(111) systemsZoellner, M. H.; Dabrowski, J.; Zaumseil, P.; Giussani, A.; Schubert, M. A.; Lupina, G.; Wilkens, H. ; Wollschlaeger, J.; Reichling, M. ; Baeumer, M.; Schroeder, T.
2012Stoichiometry-structure correlation of epitaxial Ce1-xPrxO2-delta (X=0-1) thin films on Si(111)Zoellner, Marvin Hartwig; Zaumseil, Peter; Wilkens, Henrik ; Gevers, Sebastian; Wollschlaeger, Joachim ; Baeumer, Marcus; Xie, Ya-Hong; Niu, Gang; Schroeder, Thomas
2014Structural Changes of Ultrathin Cub-PrO2(111)/Si(111) Films Due to Thermally Induced Oxygen DesorptionWilkens, H. ; Gevers, S.; Roehe, S.; Schaefer, A.; Baeumer, M.; Zoellner, M. H.; Schroeder, T.; Wollschlaeger, J.
2013Structural transitions of epitaxial ceria films on Si(111)Wilkens, H. ; Schuckmann, O.; Oelke, R.; Gevers, S.; Reichling, M. ; Schaefer, A.; Baeumer, M.; Zoellner, M. H.; Niu, G.; Schroeder, T.; Wollschlaeger, J.
2013Surface morphology of ultrathin hex-Pr2O3 films on Si(111)Wilkens, H. ; Rodewald, J. ; Gevers, S.; Zoellner, M. H.; Schroeder, T.; Wollschlaeger, J.
2011Vectorial magnetometry using magnetooptic Kerr effect including first- and second-order contributions for thin ferromagnetic filmsKuschel, T. ; Bardenhagen, H.; Wilkens, H. ; Schubert, R.; Hamrle, J.; Pistora, J.; Wollschlaeger, J.