Reichling, Michael

Full Name
Reichling, Michael
 
Variants
Reichling, M
Reichling, Michael
 
Main Affiliation
 
FIS NetID
 
 
Country
Germany
 
Lädt ... 2 0 20 0 false
 
Lädt ... 3 0 20 0 false
 

Publications

Aktive Filter:
Erscheinungsdatum:  [2000 TO 2024]
Erscheinungsdatum:  2010 - 2019

1-20 von 50

ErscheinungsdatumTitelAutor(en)
12010Ordering of monodisperse Ni nanoclusters by templating on high-temperature reconstructed alpha-Al2O3(0001)Venkataramani, K.; Helveg, S.; Hinnemann, B.; Reichling, M. ; Besenbacher, F.; Lauritsen, J. V.
22010Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopyLuebbe, Jannis; Troeger, Lutz; Torbruegge, Stefan; Bechstein, Ralf; Richter, Christoph; Kuehnle, Angelika; Reichling, Michael 
32010Clear Signature of the (2 x 1) Reconstruction of Calcite (10(1)over-bar4)Schuette, Jens; Rahe, Philipp ; Troeger, Lutz; Rode, Sebastian; Bechstein, Ralf; Reichling, Michael ; Kuehnle, Angelika
42010Quantitative description of C-60 diffusion on an insulating surfaceLoske, Felix; Luebbe, Jannis; Schuette, Jens; Reichling, Michael ; Kuehnle, Angelika
52010Atomic-resolution imaging of clean and hydrogen-terminated C(100)-(2x1) diamond surfaces using noncontact AFMNimmrich, M.; Kittelmann, M.; Rahe, P. ; Mayne, A. J.; Dujardin, G. ; von Schmidsfeld, A.; Reichling, M. ; Harneit, W. ; Kuehnle, A.
62010Unravelling the atomic structure of cross-linked (1 x 2) TiO2(110)Pieper, Hans Hermann; Venkataramani, Krithika; Torbruegge, Stefan; Bahr, Stephan; Lauritsen, Jeppe V.; Besenbacher, Flemming; Kuehnle, Angelika; Reichling, Michael 
72010Quantification of antagonistic optomechanical forces in an interferometric detection system for dynamic force microscopyTroeger, L.; Reichling, M. 
82010Morphological classification and quantitative analysis of etch pitsMotzer, C.; Reichling, M. 
92010Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tipsArai, T.; Gritschneder, S.; Troeger, L.; Reichling, M. 
102010Atomic resolution non-contact atomic force microscopy of clean metal oxide surfacesLauritsen, J. V.; Reichling, M. 
112010Monolayer Structure of Arachidic Acid on GraphiteThomas, Loji K.; Kuehnle, Angelika; Rode, Sebastian; Beginn, Uwe ; Reichling, Michael 
122011Structure and properties of oxygen centers in CaF2 crystals from ab initio embedded cluster calculationsMysovsky, Andrey S.; Sushko, Peter V.; Radzhabov, Evgeny A.; Reichling, Michael ; Shluger, Alexander L.
132011Measurement and modelling of non-contact atomic force microscope cantilever properties from ultra-high vacuum to normal pressure conditionsLuebbe, Jannis; Temmen, Matthias; Schnieder, Holger; Reichling, Michael 
142011Characterizing TiO2(110) surface states by their work functionBorodin, Andriy ; Reichling, Michael 
152011Formation of metallic colloids in CaF2 by intense ultraviolet lightRix, Stephan; Natura, Ute; Loske, Felix; Letz, Martin; Felser, Claudia; Reichling, Michael 
162011Flexible drift-compensation system for precise 3D force mapping in severe drift environmentsRahe, Philipp ; Schuette, Jens; Schniederberend, Werner; Reichling, Michael ; Abe, Masayuki; Sugimoto, Yoshiaki; Kuehnle, Angelika
172011Second-Layer Induced Island Morphologies in Thin-Film Growth of FullerenesKoerner, Martin; Loske, Felix; Einax, Mario; Kuehnle, Angelika; Reichling, Michael ; Maass, Philipp 
182011Steering molecular island morphology on an insulator surface by exploiting sequential depositionLoske, Felix; Reichling, Michael ; Kuehnle, Angelika
192011Deposition Sequence Determines Morphology of C-60 and 3,4,9,10-Perylenetetracarboxylic Diimide Islands on CaF2(111)Loske, Felix; Reichling, Michael ; Kuehnle, Angelika
202011Pressure dependence of the q-factor of cantilevers used for NC-AFMLübbe, J.; Schnieder, H.; Reichling, M.